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Investigation of oxygen vacancy and interstitial oxygen defects in ZnO films by photoluminescence and x-ray photoelectron spectroscopy 期刊论文
chinese physics letters, 2007, 卷号: 24, 期号: 7, 页码: 2108-2111
Fan HB (Fan Hai-Bo); Yang SY (Yang Shao-Yan); Zhang PF (Zhang Pan-Feng); Wei HY (Wei Hong-Yuan); Liu XL (Liu Xiang-Lin); Jiao CM (Jiao Chun-Mei); Zhu QS (Zhu Qin-Sheng); Chen YH (Chen Yong-Hai); Wang ZG (Wang Zhan-Guo)
收藏  |  浏览/下载:83/0  |  提交时间:2010/03/29
Neutron irradiation-infrared based measurement method for interstitial oxygen in heavily boron-doped silicon 期刊论文
semiconductor science and technology, 1999, 卷号: 14, 期号: 1, 页码: 74-76
Wang QY; Ma ZY; Cai TH; Yu YH; Lin LY
收藏  |  浏览/下载:42/0  |  提交时间:2010/08/12
Low-temperature (10 K) infrared measurement of interstitial oxygen in heavily antimony-doped silicon via wafer thinning 期刊论文
semiconductor science and technology, 1997, 卷号: 12, 期号: 4, 页码: 464-466
Wang QY; Cai TH; Yu YH; Lin LY
收藏  |  浏览/下载:13/0  |  提交时间:2010/11/17
Determination of interstitial oxygen concentration in heavily doped silicon by combination of neutron irradiation and FTIR 期刊论文
半导体学报, 1994, 卷号: 15, 期号: 3, 页码: 217
Ma Zhenyu; Wang Qiyuan; Zan Yude; Cai Tianhai; Yu Yuanhuan; Lin Lanying
收藏  |  浏览/下载:13/0  |  提交时间:2010/11/23


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