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Microstructure characterization of transition films from amorphous to nanocrocrystalline silicon 期刊论文
journal of crystal growth, 2003, 卷号: 256, 期号: 1-2, 页码: 27-32
Xu YY; Liao XB; Kong GL; Zeng XB; Hu ZH; Diao HW; Zhang SB
收藏  |  浏览/下载:56/0  |  提交时间:2010/08/12
Structural characterization of InGaAs/GaAs quantum dots superlattice infrared photodetector structures 期刊论文
journal of crystal growth, 1999, 卷号: 200, 期号: 3-4, 页码: 375-381
Zhuang QD; Li JM; Zeng YP; Pan L; Li HX; Kong MY; Lin LY
收藏  |  浏览/下载:27/0  |  提交时间:2010/08/12


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