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科研机构
计算技术研究所 [1]
光电技术研究所 [1]
自动化研究所 [1]
新疆天文台 [1]
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期刊论文 [3]
会议论文 [1]
发表日期
2020 [4]
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Broadband Polarization-Insensitive Tunable Absorber Using Active Frequency Selective Surface
期刊论文
IEEE Antennas and Wireless Propagation Letters, 2020, 卷号: 19, 期号: 6, 页码: 982-986
作者:
Zhao, Bo
;
Huang, Cheng
;
Yang, Jianing
;
Song, Jiakun
;
Guan, Chunlin
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2021/05/11
PIN photodiodes
Reflectivity
Resistance
Reflection
Absorption
Integrated circuit modeling
Impedance
Absorber
active frequency selective surface (AFSS)
tunable
wideband
A Structure and Circuit Coupling Modeling Method for Flexible Interconnection Points and Transmission Performance of Gold Belt in Microwave Modules
会议论文
Hong Kong, China, August 12, 2019 - August 15, 2019
作者:
Tian, Jun
;
Wang, Congsi
;
Liu, Shaoyi
;
Zhu, Cheng
;
Zhou, Cheng
收藏
  |  
浏览/下载:18/0
  |  
提交时间:2021/07/06
Microwave circuits
Belts
Electronics packaging
Flexible electronics
Gold
Integrated circuit interconnects
Microwaves
Timing circuits
A Minimum-Cost Modeling Method for Nonlinear Industrial Process Based on Multimodel Migration and Bayesian Model Averaging Method
期刊论文
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2020, 卷号: 17, 期号: 2, 页码: 947-956
作者:
Chu, Fei
;
Dai, Bangwu
;
Ma, Xiaoping
;
Wang, Fuli
;
Ye, Bin
收藏
  |  
浏览/下载:15/0
  |  
提交时间:2020/06/22
Predictive models
Data models
Adaptation models
Process control
Computational modeling
Integrated circuit modeling
Bayes methods
Bayesian model averaging (BMA)
minimum cost
multimodel migration
nonlinear
performance prediction
Software-Based Self-Testing Using Bounded Model Checking for Out-of-Order Superscalar Processors
期刊论文
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2020, 卷号: 39, 期号: 3, 页码: 714-727
作者:
Zhang, Ying
;
Chakrabarty, Krishnendu
;
Peng, Zebo
;
Rezine, Ahmed
;
Li, Huawei
收藏
  |  
浏览/下载:16/0
  |  
提交时间:2020/12/10
Circuit faults
Built-in self-test
Out of order
Model checking
Integrated circuit modeling
Bounded model checking (BMC)
online testing
out-of-order superscalar processors
software-based self-testing (SBST)
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