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Novel Low Cost and Double Node Upset Tolerant Latch Design for Nanoscale CMOS Technology 期刊论文
Proceedings of the Asian Test Symposium, 2016, 页码: 252-256
作者:  Liang,Huaguo;  Xu,Xiaolin;  Fang,Xiangsheng;  Yan,Aibin;  Huang,Zhengfeng
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