CORC

浏览/检索结果: 共1条,第1-1条 帮助

限定条件        
已选(0)清除 条数/页:   排序方式:
New Framework for the random charging/discharging of oxide traps in HfO2 gate dielectric: Ab-initio simulation and experimental evidence 其他
2015-01-01
Ji, Jingwei; Qiu, Yingxin; Guo, Shaofeng; Wang, Runsheng; Ren, Pengpeng; Hao, Peng; Huang, Ru
收藏  |  浏览/下载:4/0  |  提交时间:2017/12/03


©版权所有 ©2017 CSpace - Powered by CSpace