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Electrical characterization of semiconductor nanowires by scanning tunneling microscopy 会议论文
Quantum Dots and Nanostructures: Synthesis, Characterization, and Modeling XI, 2014-02-03
作者:  Durand, Corentin[1];  Capoid, Pierre[2];  Berthe, M.[3];  Xu, Tao[4];  Nys, Jean-Philippe[5]
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