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New Insights into Oxide Traps Characterization in Gate-All-Around Nanowire Transistors with TiN Metal Gates Based on Combined I(g)-I(d) RTS Technique 其他
2009-01-01
Zhang, Liangliang; Zhuge, Jing; Wang, Runsheng; Huang, Ru; Liu, Changze; Wu, Dake; Kang, Zhaoyi; Kim, Done-Won; Park, Donggun; Wang, Yangyuan
收藏  |  浏览/下载:4/0  |  提交时间:2015/11/13
New insights into oxide traps characterization in gate-all-around nanowire transistors with TiN metal gates based on combined Ig-Id RTS technique 其他
2009-01-01
Zhang, Liangliang; Zhuge, Jing; Wang, Runsheng; Huang, Ru; Liu, Changze; Wu, Dake; Kang, Zhaoyi; Kim, Dong-Won; Park, Donggun; Wang, Yangyuan
收藏  |  浏览/下载:5/0  |  提交时间:2015/11/13


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