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Characterization of stress induced in SOS and Si/gamma-Al2O3/Si heteroepitaxial thin films by Raman spectroscopy 外文期刊
2005
作者:  Wang, QY;  Wang, J;  Wang, JH;  Liu, ZL;  Lin, LY
收藏  |  浏览/下载:9/0  |  提交时间:2010/11/26
Effects of techniques of implanting nitrogen into buried oxide on the characteristics of partially depleted SOIPMOSFET 外文期刊
2005
作者:  Zheng, ZS;  Liu, ZL;  Zhang, GQ;  Li, N;  Fan, K
收藏  |  浏览/下载:7/0  |  提交时间:2010/11/26
Improvement of the radiation hardness of SIMOX buried layers using nitrogen implantation 外文期刊
2005
作者:  Zheng, ZS;  Liu, ZL;  Zhang, GQ;  Li, N;  Li, GH
收藏  |  浏览/下载:14/0  |  提交时间:2010/11/26
Oxides  


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