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Impact of leakage currents on MOSFET noise performance in deep sub-micron regime 其他
2004-01-01
Liu, HW; Huang, GY; Huang, R; Zhang, X
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
Impact of leakage currents on MOSFET noise performance in deep sub-micron regime 其他
2004-01-01
Liu, Hongwei; Zhang, Guoyan; Huang, Ru; Zhang, Xing
收藏  |  浏览/下载:2/0  |  提交时间:2015/11/13
A study of source/drain-on-insulator structure for extremely scaled MOSFETs 其他
2004-01-01
Zhang, Zhikuan; Zhang, Shengdong; Feng, Chuguang; Chan, Mansun
收藏  |  浏览/下载:3/0  |  提交时间:2015/11/13


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