CORC
当前检索式 ((ALL:Nanolithography))
限定条件
共36条,第1-36条
Chemistry 4 Polymer Science 3 optics 3
光电子学 3 Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Optics 2 光电子技术 2
半导体物理 2 材料科学与物理化学 2 APPROXIMATE BOUNDARY-CONDITIONS; BROAD-BAND; DIFFRACTION LIMIT; INTERFERENCE NANOLITHOGRAPHY; POLARIZATION CONVERSION; TERAHERTZ METAMATERIAL; PHASE DISCONTINUITIES; NEGATIVE REFRACTION; PERFECT ABSORPTION; OPTICAL HYPERLENS 1
Alignment - Demodulation - Frequency domain analysis - Information filtering - Optical variables measurement 1 Biochemical Research Methods; Chemistry, Multidisciplinary; Nanoscience & Nanotechnology 1 Biochemistry & Molecular Biology; Biophysics 1
Chemistry; Nuclear Science & Technology 1 Chemistry; Physics 1 Computer simulation - Cylinders (shapes) - Masks - Multilayers - Nanophotonics - Photoresists 1
Computer simulation - Leveling (machinery) - Nanolithography 1 Diffraction - Photolithography 1 Electric fields - Electromagnetic wave reflection - Finite difference time domain method - Nanolithography - Nanostructures 1
Engineering 1 Engineering, Electrical & Electronic; Nanoscience & Nanotechnology; Materials Science, Multidisciplinary; Physics, Applied 1 Instruments & Instrumentation; Optics; Physics 1
Nanolithography; Surface plasmon; Illumination design 1 OFF-AXIS ILLUMINATION; NEAR-FIELD; NANOLITHOGRAPHY; LITHOGRAPHY; ANTENNAS; LENS 1 SCANNING INTERFEROMETER; THICKNESS MEASUREMENT; SILVER SUPERLENS; LITHOGRAPHY; RESOLUTION; PHOTOLITHOGRAPHY; EVANESCENT; LIGHT; FILM; NANOLITHOGRAPHY 1
SUPER-OSCILLATORY LENS; CYLINDRICAL-VECTOR BEAMS; DIFFRACTION LIMIT; STOKES PARAMETERS; BINARY OPTICS; PHASE; WAVELENGTHS; FIELDS 1 Science & Technology - Other Topics; Materials Science; Physics 1 Surface plasmons; Image formation theory; Superresolution; Nanolithography 1
engineering 1 multidisciplinary sciences 1 physics 1
science & technology - other topics 1 光存储 1 光学材料;晶体 1
力学 1 物理化学 1 高分子化学 1

©版权所有 ©2017 CSpace - Powered by CSpace