Investigation of Local Tunneling Current Noise Spectra on the Silicon Crystal Surfaces by Means of STM/STS | |
Mantsevich, V. N.1; Maslova, N. S.1; Cao, G. Y.2 | |
刊名 | JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS |
2015-08-01 | |
卷号 | 121期号:2页码:259-262 |
英文摘要 | We report on a careful analysis of the local tunneling conductivity by means of ultra-high vacuum scanning tunneling microscopy/spectroscopy (STM/STS) technique in the vicinity of low-dimensional structures on the Si(111)-(7 x 7) and Si(110)-(16 x 2) surfaces. The power-law exponent alpha of low-frequency tunneling current noise spectra is investigated for different values of the tunneling contact parameters: relaxation rates, the localized state coupling, and the tunneling barrier width and height. |
WOS标题词 | Science & Technology ; Physical Sciences |
类目[WOS] | Physics, Multidisciplinary |
研究领域[WOS] | Physics |
关键词[WOS] | MICROSCOPY |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000361441400012 |
公开日期 | 2015-11-03 |
内容类型 | 期刊论文 |
源URL | [http://ir.wipm.ac.cn/handle/112942/8171] |
专题 | 武汉物理与数学研究所_2011年以前论文发表(包括2011年) |
作者单位 | 1.Moscow MV Lomonosov State Univ, Dept Phys, Moscow 119991, Russia 2.Chinese Acad Sci, Wuhan Inst Phys & Math, Beijing 100864, Peoples R China |
推荐引用方式 GB/T 7714 | Mantsevich, V. N.,Maslova, N. S.,Cao, G. Y.. Investigation of Local Tunneling Current Noise Spectra on the Silicon Crystal Surfaces by Means of STM/STS[J]. JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS,2015,121(2):259-262. |
APA | Mantsevich, V. N.,Maslova, N. S.,&Cao, G. Y..(2015).Investigation of Local Tunneling Current Noise Spectra on the Silicon Crystal Surfaces by Means of STM/STS.JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS,121(2),259-262. |
MLA | Mantsevich, V. N.,et al."Investigation of Local Tunneling Current Noise Spectra on the Silicon Crystal Surfaces by Means of STM/STS".JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS 121.2(2015):259-262. |
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