Investigation of Local Tunneling Current Noise Spectra on the Silicon Crystal Surfaces by Means of STM/STS
Mantsevich, V. N.1; Maslova, N. S.1; Cao, G. Y.2
刊名JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS
2015-08-01
卷号121期号:2页码:259-262
英文摘要We report on a careful analysis of the local tunneling conductivity by means of ultra-high vacuum scanning tunneling microscopy/spectroscopy (STM/STS) technique in the vicinity of low-dimensional structures on the Si(111)-(7 x 7) and Si(110)-(16 x 2) surfaces. The power-law exponent alpha of low-frequency tunneling current noise spectra is investigated for different values of the tunneling contact parameters: relaxation rates, the localized state coupling, and the tunneling barrier width and height.
WOS标题词Science & Technology ; Physical Sciences
类目[WOS]Physics, Multidisciplinary
研究领域[WOS]Physics
关键词[WOS]MICROSCOPY
收录类别SCI
语种英语
WOS记录号WOS:000361441400012
公开日期2015-11-03
内容类型期刊论文
源URL[http://ir.wipm.ac.cn/handle/112942/8171]  
专题武汉物理与数学研究所_2011年以前论文发表(包括2011年)
作者单位1.Moscow MV Lomonosov State Univ, Dept Phys, Moscow 119991, Russia
2.Chinese Acad Sci, Wuhan Inst Phys & Math, Beijing 100864, Peoples R China
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GB/T 7714
Mantsevich, V. N.,Maslova, N. S.,Cao, G. Y.. Investigation of Local Tunneling Current Noise Spectra on the Silicon Crystal Surfaces by Means of STM/STS[J]. JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS,2015,121(2):259-262.
APA Mantsevich, V. N.,Maslova, N. S.,&Cao, G. Y..(2015).Investigation of Local Tunneling Current Noise Spectra on the Silicon Crystal Surfaces by Means of STM/STS.JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS,121(2),259-262.
MLA Mantsevich, V. N.,et al."Investigation of Local Tunneling Current Noise Spectra on the Silicon Crystal Surfaces by Means of STM/STS".JOURNAL OF EXPERIMENTAL AND THEORETICAL PHYSICS 121.2(2015):259-262.
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