A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance

	A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance
	Sun, Yujing ; Wen, Zhiwei ; Xu, Fugang ; Zhang,Yue ; Shi,Yan ; Dai,Haichao ; Li,Zhuang
刊名	analytical methods
	2014
卷号	6 期号:2 页码:337-340
关键词	METAL-FILMS THIN CONDUCTIVITY ULTRATHIN COALESCENCE RESISTIVITY
通讯作者	li,z
英文摘要	in this report, it was found that the napierian logarithm of the electrical resistance is proportional to the reciprocal thickness for the platinum nanofilms. a new method was proposed to determine the thickness of platinum nanofilm simply by measuring its electrical resistance, which is fast and cost effective.
收录类别	SCI
语种	英语
WOS记录号	WOS:000329072200001
内容类型	期刊论文
源URL	[http://ir.ciac.jl.cn/handle/322003/57472]
专题	长春应用化学研究所_长春应用化学研究所知识产出_期刊论文
推荐引用方式 GB/T 7714	Sun, Yujing,Wen, Zhiwei,Xu, Fugang,et al. A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance[J]. analytical methods,2014,6(2):337-340.
APA	Sun, Yujing.,Wen, Zhiwei.,Xu, Fugang.,Zhang,Yue.,Shi,Yan.,...&Li,Zhuang.(2014).A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance.analytical methods,6(2),337-340.
MLA	Sun, Yujing,et al."A new method to determine the thickness of platinum nanofilm simply by measuring its electrical resistance".analytical methods 6.2(2014):337-340.