TIRF microscopy with ultra-short penetration depth

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	TIRF microscopy with ultra-short penetration depth
	Shen, H ; Huang, E ; Das, T ; Xu, HX ; Ellisman, M ; Liu, ZW
刊名	OPTICS EXPRESS
	2014
卷号	22 期号:9 页码:10728
ISSN号	1094-4087
通讯作者	Liu, ZW (reprint author), Univ Calif San Diego, Dept Elect & Comp Engn, 9500 Gilman Dr, La Jolla, CA 92093 USA.
中文摘要	Total internal reflection fluorescence microscopy (TIRF), in both commercial and custom-built configurations, is widely used for high signal-noise ratio imaging. The imaging depth of traditional TIRF is sensitive to the incident angle of the laser, and normally limited to around 100 nm. In our paper, using a high refractive index material and the evanescent waves of various waveguide modes, we propose a compact and tunable ultra-short decay length TIRF system, which can reach decay lengths as short as 19 nm, and demonstrate its application for imaging fluorescent dye-labeled F-actin in HeLa cells. (C) 2014 Optical Society of America
资助信息	NSF-ECCS [0969405]
语种	英语
公开日期	2015-04-14
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/59422]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Shen, H,Huang, E,Das, T,et al. TIRF microscopy with ultra-short penetration depth[J]. OPTICS EXPRESS,2014,22(9):10728.
APA	Shen, H,Huang, E,Das, T,Xu, HX,Ellisman, M,&Liu, ZW.(2014).TIRF microscopy with ultra-short penetration depth.OPTICS EXPRESS,22(9),10728.
MLA	Shen, H,et al."TIRF microscopy with ultra-short penetration depth".OPTICS EXPRESS 22.9(2014):10728.