Enhancement of room temperature ferromagnetism in Cu-doped AlN thin film by defect engineering | |
Luo, JT ; Li, YZ ; Kang, XY ; Zeng, F ; Pan, F ; Fan, P ; Jiang, Z ; Wang, Y | |
刊名 | JOURNAL OF ALLOYS AND COMPOUNDS |
2014 | |
卷号 | 586页码:469—474 |
关键词 | MAGNETIC-PROPERTIES ZNO FILMS CR-ALN NITRIDE RAMAN GAN TEXTURE IONS |
ISSN号 | 0925-8388 |
通讯作者 | luojt@hotmail.com ; zengfei@mail.tsinghua.edu.cn |
英文摘要 | Cu-doped AlN thin films were deposited by reactive magnetron co-sputtering at room temperature. The results showed that all the Cu-doped AlN films exhibited room-temperature ferromagnetism (RTFM). The results also showed that when the Cu-doping content was at 4 at.%, the maximum atomic magnetic moment (AMM) was about similar to 0.6 mu(B)/Cu. Raman and X-ray absorption spectroscopy showed that large numbers of N-related defects existed in Cu-doped AlN films, which was ascribed to its intrinsic RTFM. Moreover, to verify the role of defects on the RTFM of Cu-doped AlN films, defects were artificially introduced into Al0.96Cu0.04N films by carbon implantation. After carbon implantation, the AMM was significantly enhanced to similar to 2.5 mu(B)/Cu. After examination and discussion of the results, we believed that C-N compounds were formed as carbon implantation, which consumed part of the available nitrogen and then increased the density of N-related defects in Al0.96Cu0.04N films. This is favorable for coupling among bound magnetic polarons (BMP). Therefore RTFM is strongly correlated to engineered defects in Cu-doped AlN films. These results promote a viable route to enhance the RTFM of III-nitrides dilute magnetic semiconductors via defect engineering. Crown Copyright (C) 2013 Published by Elsevier B. V. All rights reserved. |
收录类别 | SCI |
语种 | 英语 |
WOS记录号 | WOS:000329856800074 |
公开日期 | 2015-03-13 |
内容类型 | 期刊论文 |
源URL | [http://ir.sinap.ac.cn/handle/331007/14119] |
专题 | 上海应用物理研究所_中科院上海应用物理研究所2011-2017年 |
推荐引用方式 GB/T 7714 | Luo, JT,Li, YZ,Kang, XY,et al. Enhancement of room temperature ferromagnetism in Cu-doped AlN thin film by defect engineering[J]. JOURNAL OF ALLOYS AND COMPOUNDS,2014,586:469—474. |
APA | Luo, JT.,Li, YZ.,Kang, XY.,Zeng, F.,Pan, F.,...&Wang, Y.(2014).Enhancement of room temperature ferromagnetism in Cu-doped AlN thin film by defect engineering.JOURNAL OF ALLOYS AND COMPOUNDS,586,469—474. |
MLA | Luo, JT,et al."Enhancement of room temperature ferromagnetism in Cu-doped AlN thin film by defect engineering".JOURNAL OF ALLOYS AND COMPOUNDS 586(2014):469—474. |
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