A Wafer-Level Sn-Rich Au-Sn Bonding Technique and Its Application in Surface Plasmon Resonance Sensors | |
Mao, X ; Lv, XD ; Wei, WW ; Zhang, Z ; Yang, JL ; Qi, ZM ; Yang, FH | |
刊名 | chinese physics letters |
2014 | |
卷号 | 31期号:5页码:056803 |
学科主题 | 微电子学 |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2015-04-02 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/26315] |
专题 | 半导体研究所_半导体集成技术工程研究中心 |
推荐引用方式 GB/T 7714 | Mao, X,Lv, XD,Wei, WW,et al. A Wafer-Level Sn-Rich Au-Sn Bonding Technique and Its Application in Surface Plasmon Resonance Sensors[J]. chinese physics letters,2014,31(5):056803. |
APA | Mao, X.,Lv, XD.,Wei, WW.,Zhang, Z.,Yang, JL.,...&Yang, FH.(2014).A Wafer-Level Sn-Rich Au-Sn Bonding Technique and Its Application in Surface Plasmon Resonance Sensors.chinese physics letters,31(5),056803. |
MLA | Mao, X,et al."A Wafer-Level Sn-Rich Au-Sn Bonding Technique and Its Application in Surface Plasmon Resonance Sensors".chinese physics letters 31.5(2014):056803. |
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