Formation and stability of point defects in monolayer rhenium disulfide

	Formation and stability of point defects in monolayer rhenium disulfide
	Horzum, S ; Cakir, D ; Suh, J ; Tongay, S ; Huang, YS ; Ho, CH ; Wu, J ; Sahin, H ; Peeters, FM
刊名	physical review b
	2014
卷号	89 期号:15 页码:155433
学科主题	半导体物理
收录类别	SCI
语种	英语
公开日期	2015-04-02
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/26398]
专题	半导体研究所_半导体超晶格国家重点实验室
推荐引用方式 GB/T 7714	Horzum, S,Cakir, D,Suh, J,et al. Formation and stability of point defects in monolayer rhenium disulfide[J]. physical review b,2014,89(15):155433.
APA	Horzum, S.,Cakir, D.,Suh, J.,Tongay, S.,Huang, YS.,...&Peeters, FM.(2014).Formation and stability of point defects in monolayer rhenium disulfide.physical review b,89(15),155433.
MLA	Horzum, S,et al."Formation and stability of point defects in monolayer rhenium disulfide".physical review b 89.15(2014):155433.