The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN
Li, X. J. ; Zhao, D. G. ; Jiang, D. S. ; Liu, Z. S. ; Chen, P. ; Zhu, J. J. ; Le, L. C. ; Yang, J. ; He, X. G. ; Zhang, S. M. ; Zhang, B. S. ; Liu, J. P. ; Yang, H.
刊名journal of applied physics
2014
卷号116期号:16页码:163708
学科主题光电子学
收录类别SCI
语种英语
公开日期2015-03-19
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/26024]  
专题半导体研究所_光电子研究发展中心
推荐引用方式
GB/T 7714
Li, X. J.,Zhao, D. G.,Jiang, D. S.,et al. The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN[J]. journal of applied physics,2014,116(16):163708.
APA Li, X. J..,Zhao, D. G..,Jiang, D. S..,Liu, Z. S..,Chen, P..,...&Yang, H..(2014).The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN.journal of applied physics,116(16),163708.
MLA Li, X. J.,et al."The significant effect of the thickness of Ni film on the performance of the Ni/Au Ohmic contact to p-GaN".journal of applied physics 116.16(2014):163708.
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