High temperature operating (80C) 795-nm VCSEL based on InAlGaAs MQWs active region
Zhang X.
2013
会议名称5th International Symposium on Photoelectronic Detection and Imaging, ISPDI 2013, June 25, 2013 - June 27, 2013
会议地点Beijing, China
英文摘要Design of the active region and analysis of temperature sensitivity of high-temperature operating 795-nm special VCSELs for Chip-Scale Atomic Clock (CSAC) are presented. Composition and thickness of the InAlGaAs multiple quantum wells (MQWs) are optimized at room and elevated temperatures. Temperature sensitivity of the threshold current is analyzed by calculating the temperature dependence of cavity-mode gain over a broad temperature range (25C-150C). A self-consistent VCSEL model based on quasi 3D finite element analysis is employed to investigate self-heating effects and temperature distribution in the proposed structure. Output power of 2.5mW is expected from 10m aperture VCSELs at 10mA current at ambient temperature of 358K. 2013 SPIE.
收录类别EI
会议录5th International Symposium on Photoelectronic Detection and Imaging, ISPDI 2013, June 25, 2013 - June 27, 2013
会议录出版者SPIE
会议录出版地Beijing, China
内容类型会议论文
源URL[http://ir.ciomp.ac.cn/handle/181722/41079]  
专题长春光学精密机械与物理研究所_中科院长春光机所知识产出_会议论文
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Zhang X.. High temperature operating (80C) 795-nm VCSEL based on InAlGaAs MQWs active region[C]. 见:5th International Symposium on Photoelectronic Detection and Imaging, ISPDI 2013, June 25, 2013 - June 27, 2013. Beijing, China.
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