Experimental studies of single-event effects induced by heavy ions

	Experimental studies of single-event effects induced by heavy ions
	Liu, J.; Hou, M. D.; Li, B. Q.; Liu, C. L.; Wang, Z. G.; Cheng, S.; Sun, Y. M.; Jin, Y. F.; Lin YL(林云龙); Cai JR(蔡金荣)
	2000
会议名称	18th International Conference on Atomic Collisions in Solids (ICACS-18)
会议日期	1999
会议地点	Odense, Denmark
页码	973-978
英文摘要	This paper presents the results of ground-based heavy ion test of single-event effect (SEE) vulnerability on microcircuits used in space. We observed the dependence of upset cross-sections on the incident angle of ions in Intel 8086 CPU. SEU cross-sections of various SRAMs did not depend on the stored pattern, but 0 --> 1 and 1 --> 0 transitions were completely different for different manufacturer products. Some SEE protection methods were verified in conditions of ground simulation experiments.
收录类别	CPCI
会议录	Nuclear instruments & methods in physics research section b-beam interactions with materials and atoms
会议录出版者	Elsevier Science Bv
会议录出版地	AMSTERDAM
学科主题	空间环境
语种	英语
ISBN号	0168-583X
内容类型	会议论文
源URL	[http://ir.cssar.ac.cn/handle/122/125]
专题	国家空间科学中心_空间环境部
推荐引用方式 GB/T 7714	Liu, J.,Hou, M. D.,Li, B. Q.,et al. Experimental studies of single-event effects induced by heavy ions[C]. 见:18th International Conference on Atomic Collisions in Solids (ICACS-18). Odense, Denmark. 1999.