Far-field pattern simulation and measurement for unidirectional-emission circular microlasers
Yong-Zhen Huang ; Xiao-Meng Lv ; Heng Long ; Ling-Xiu Zou ; Qi-Feng Yao ; Yue-De Yang ; Xin Jin ; Ming-Ying Tang ; Jin-Long Xiao ; Yun Du
刊名proceedings of spie - the international society for optical engineering
2013
卷号8600页码:86001i
学科主题光电子学
收录类别EI
语种英语
公开日期2014-05-08
内容类型期刊论文
源URL[http://ir.semi.ac.cn/handle/172111/24896]  
专题半导体研究所_集成光电子学国家重点实验室
推荐引用方式
GB/T 7714
Yong-Zhen Huang,Xiao-Meng Lv,Heng Long,et al. Far-field pattern simulation and measurement for unidirectional-emission circular microlasers[J]. proceedings of spie - the international society for optical engineering,2013,8600:86001i.
APA Yong-Zhen Huang.,Xiao-Meng Lv.,Heng Long.,Ling-Xiu Zou.,Qi-Feng Yao.,...&Yun Du.(2013).Far-field pattern simulation and measurement for unidirectional-emission circular microlasers.proceedings of spie - the international society for optical engineering,8600,86001i.
MLA Yong-Zhen Huang,et al."Far-field pattern simulation and measurement for unidirectional-emission circular microlasers".proceedings of spie - the international society for optical engineering 8600(2013):86001i.
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