Thickness dependence of piezoelectric property of ultrathin BiFeO3 films

CORC > 物理研究所 > 物理所公开发表论文 > 期刊论文

	Thickness dependence of piezoelectric property of ultrathin BiFeO3 films
	Zhao, JL ; Lu, HX ; Sun, JR ; Shen, BG
刊名	PHYSICA B-CONDENSED MATTER
	2012
卷号	407 期号:12 页码:2258
关键词	THIN-FILMS FERROELECTRICITY
ISSN号	0921-4526
通讯作者	Sun, JR (reprint author), Chinese Acad Sci, Beijing Natl Lab Condensed Matter Phys, Beijing 100190, Peoples R China.
中文摘要	Effects of film thickness on the piezoelectric property of the ultrathin BiFeO3 films (t=1-150 nm), grown on the (0 0 1)-SrTiO3 substrates with a La0.67Sr0.33MnO3 cover layer, have been studied by the technique of piezoresponse force microscope. Special attention has been paid to the evolution of the piezoelectric response with film thickness. Well ferroelectric property maintains in the BFO film with a thickness down to 6 nm, below which no obvious ferroelectric domains are observed. Based on careful analysis of the piezoelectric response images of the ferroelectric domains upwards or downwards poled by external field, a quantitative description of the piezoelectric coefficient d(33) can be obtained. d(33) is found to display a monotonic decrease with the decrease of film thickness, descending from similar to 46 pm/V for t=150 nm to similar to 8 pm/V for t=6 nm. A corresponding growth of the out-of-plane lattice parameter of the film from 4.011 angstrom to 4.077 angstrom is also observed. The effects of depolarization, lattice strains and substrate clamping on the piezoelectric property of the films are discussed. (C) 2012 Elsevier B.V. All rights reserved.
收录类别	SCI
资助信息	National Natural Science Foundation of China; National Fundamental Research of China; Chinese Academy of Sciences
语种	英语
公开日期	2013-09-23
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/45821]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Zhao, JL,Lu, HX,Sun, JR,et al. Thickness dependence of piezoelectric property of ultrathin BiFeO3 films[J]. PHYSICA B-CONDENSED MATTER,2012,407(12):2258.
APA	Zhao, JL,Lu, HX,Sun, JR,&Shen, BG.(2012).Thickness dependence of piezoelectric property of ultrathin BiFeO3 films.PHYSICA B-CONDENSED MATTER,407(12),2258.
MLA	Zhao, JL,et al."Thickness dependence of piezoelectric property of ultrathin BiFeO3 films".PHYSICA B-CONDENSED MATTER 407.12(2012):2258.