Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy | |
Dong, ZF ; Peng, LM ; Luck, R ; Lu, K | |
刊名 | PHILOSOPHICAL MAGAZINE LETTERS |
1998 | |
卷号 | 77期号:6页码:345 |
关键词 | GRAIN-GROWTH |
ISSN号 | 0950-0839 |
通讯作者 | Dong, ZF (reprint author), Chinese Acad Sci, Inst Phys, Beijing Lab Electron Microscopy, POB 2724, Beijing 100080, Peoples R China. |
中文摘要 | The thermal stability of a nanocrystalline (NC) Hf11Ni89 alloy was studied using X-ray diffraction, transmission electron microscopy, resistivity measurements and magnetothermal analysis. Microstructure and composition evolution in the grain boundaries and nanograins prior to evident grain growth was detected, and it was shown that this evolution may have a significant influence on the electrical resistivity and magnetic properties of the sample. Our findings demonstrated that the thermal stability of properties of NC materials is not necessarily equivalent to the grain-size stability of the same materials. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-23 |
内容类型 | 期刊论文 |
源URL | [http://ir.iphy.ac.cn/handle/311004/45741] |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Dong, ZF,Peng, LM,Luck, R,et al. Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy[J]. PHILOSOPHICAL MAGAZINE LETTERS,1998,77(6):345. |
APA | Dong, ZF,Peng, LM,Luck, R,&Lu, K.(1998).Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy.PHILOSOPHICAL MAGAZINE LETTERS,77(6),345. |
MLA | Dong, ZF,et al."Thermal stability of electrical and magnetic properties of a nanocrystalline Hf-Ni alloy".PHILOSOPHICAL MAGAZINE LETTERS 77.6(1998):345. |
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