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Microstructure of GaN films grown on Si(111) substrates by metalorganic chemical vapor deposition
Hu, GQ ; Kong, X ; Wan, L ; Wang, YQ ; Duan, XF ; Lu, Y ; Liu, XL
刊名JOURNAL OF CRYSTAL GROWTH
2003
卷号256期号:3-4页码:416
关键词MOLECULAR-BEAM EPITAXY HIGH-QUALITY GAN HETEROEPITAXIAL GROWTH ELECTRON-DIFFRACTION DEFECT STRUCTURE HETEROSTRUCTURE DISLOCATIONS MICROSCOPY (111)SI LAYER
ISSN号0022-0248
通讯作者Hu, GQ: Chinese Acad Sci, Inst Phys, Beijing Lab Electron Microscopy, POB 2724, Beijing 100080, Peoples R China.
中文摘要We report the transmission electron microscopy (TEM) study of the microstructure of wurtzitic GaN films grown on Si(I I I) substrates with AlN buffer layers by metalorganic chemical vapor deposition (MOCVD) method. An amorphous layer was formed at the interface between Si and AlN when thick GaN film was grown. We propose the amorphous layer was induced by the large stress at the interface when thick GaN was grown. The In0.1Ga0.9N/GaN multiple quantum well (MQW) reduced the dislocation density by obstructing the mixed and screw dislocations from passing through the MQW. But no evident reduction of the edge dislocations by the MQW was observed. It was found that dislocations located at the boundaries of grains slightly in-plane misoriented have screw component. Inversion domain is also observed. (C) 2003 Elsevier B.V. All rights reserved.
收录类别SCI
语种英语
公开日期2013-09-18
内容类型期刊论文
源URL[http://ir.iphy.ac.cn/handle/311004/42117]  
专题物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式
GB/T 7714
Hu, GQ,Kong, X,Wan, L,et al. Microstructure of GaN films grown on Si(111) substrates by metalorganic chemical vapor deposition[J]. JOURNAL OF CRYSTAL GROWTH,2003,256(3-4):416.
APA Hu, GQ.,Kong, X.,Wan, L.,Wang, YQ.,Duan, XF.,...&Liu, XL.(2003).Microstructure of GaN films grown on Si(111) substrates by metalorganic chemical vapor deposition.JOURNAL OF CRYSTAL GROWTH,256(3-4),416.
MLA Hu, GQ,et al."Microstructure of GaN films grown on Si(111) substrates by metalorganic chemical vapor deposition".JOURNAL OF CRYSTAL GROWTH 256.3-4(2003):416.
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