Electron diffraction and photoemission studies of clean and water-covered Si(5,5,12) and Si(112) surfaces | |
Ranke, W ; Xing, YR | |
刊名 | SURFACE REVIEW AND LETTERS |
1997 | |
卷号 | 4期号:1页码:15 |
关键词 | SCANNING-TUNNELING-MICROSCOPY MILLER INDEX SURFACES ATOMIC-STRUCTURE ADSORPTION SILICON H2O LEED SI MODEL |
ISSN号 | 0218-625X |
通讯作者 | Ranke, W: MAX PLANCK GESELL,FRITZ HABER INST,FARADAYWEG 4-6,D-14195 BERLIN,GERMANY. |
中文摘要 | The structure of silicon surfaces in the orientation range (113)-(5,5,12)-(337)-(112) has been investigated using high resolution LEED and photoemission both on a spherical and on flat samples. We find that Si(5,5,12) [5.3 degrees from (113) and 0.7 degrees from (937)] is the only stable orientation between (113) and (111) and confirm the result of Baski et al. [Science 269, 1556 (1995)] that it has a 2 x 1 superstructure with a very large unit cell of 7.68 x 53.5 Angstrom(2). Adsorption measurements of water on Si(5,5,12) yield a mobile precursor kinetics with two kinds of regions saturating at 0.25 and 0.15 ML which are related to adsorption on different sites. Using these results, a modified structure model is proposed. Surfaces between (113) and (5,5,12) separate into facets of these two orientations; between (5,5,12) and (112), they separate into (5,5,12) and (111) facets. (337) facets in this range may be considered as defective (5,5,12) facets. |
收录类别 | SCI |
语种 | 英语 |
公开日期 | 2013-09-17 |
内容类型 | 期刊论文 |
源URL | [http://ir.iphy.ac.cn/handle/311004/37069] |
专题 | 物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文 |
推荐引用方式 GB/T 7714 | Ranke, W,Xing, YR. Electron diffraction and photoemission studies of clean and water-covered Si(5,5,12) and Si(112) surfaces[J]. SURFACE REVIEW AND LETTERS,1997,4(1):15. |
APA | Ranke, W,&Xing, YR.(1997).Electron diffraction and photoemission studies of clean and water-covered Si(5,5,12) and Si(112) surfaces.SURFACE REVIEW AND LETTERS,4(1),15. |
MLA | Ranke, W,et al."Electron diffraction and photoemission studies of clean and water-covered Si(5,5,12) and Si(112) surfaces".SURFACE REVIEW AND LETTERS 4.1(1997):15. |
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