Electrical transport through individual nanowires with transverse grain boundaries

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	Electrical transport through individual nanowires with transverse grain boundaries
	Xue, XY ; Feng, P ; Wang, C ; Chen, YJ ; Wang, YG ; Wang, TH
刊名	APPLIED PHYSICS LETTERS
	2006
卷号	89 期号:2
关键词	SENSING CHARACTERISTICS SCHOTTKY DIODES ZNO
ISSN号	0003-6951
通讯作者	Wang, TH: Hunan Univ, MicroNano Technol Res Ctr, Changsha 410082, Peoples R China.
中文摘要	The growth of well-ordered Mn nanodots arrays on Si(111)-7 x 7 reconstructed surfaces was investigated by means of scanning tunnelling microscopy (STM) as well as kinetic Monte Carlo (KMC) simulation. Mn atoms deposited slowly onto elevated substrates were observed to occupy preferentially on the faulted half unit cells (FHUCs) of the Si(111)-7 x 7 surface. The preference occupancy in the FHUCs, PF, defined as the ratio of the number of FHUCs occupied by Mn nanodots to the number of all occupied in the two halves, decreases with increasing deposition rate as well as decreasing substrate temperature. The KMC simulations, which are in good agreement with the experimental results, were employed to optimize the growth conditions, including deposition rate and substrate temperature, for the self-organized growth of Mn nanodots arrays on Si(111)-7 x 7 reconstructed surfaces. By adjusting the deposition rate, one can control the growth of well-ordered and uniform Mn nanodots arrays to form either a triangular symmetry or a honeycomb one.
收录类别	SCI
语种	英语
公开日期	2013-09-17
内容类型	期刊论文
源URL	[http://ir.iphy.ac.cn/handle/311004/36965]
专题	物理研究所_物理所公开发表论文_物理所公开发表论文_期刊论文
推荐引用方式 GB/T 7714	Xue, XY,Feng, P,Wang, C,et al. Electrical transport through individual nanowires with transverse grain boundaries[J]. APPLIED PHYSICS LETTERS,2006,89(2).
APA	Xue, XY,Feng, P,Wang, C,Chen, YJ,Wang, YG,&Wang, TH.(2006).Electrical transport through individual nanowires with transverse grain boundaries.APPLIED PHYSICS LETTERS,89(2).
MLA	Xue, XY,et al."Electrical transport through individual nanowires with transverse grain boundaries".APPLIED PHYSICS LETTERS 89.2(2006).