Microstructure and electrical properties of La2Ti2O7 thin films on SrTiO3 substrates

doi:10.1016/j.apsusc.2021.151599

CORC > 金属研究所 > 中国科学院金属研究所

	Microstructure and electrical properties of La2Ti2O7 thin films on SrTiO3 substrates
	Qiao, Beibei 1,2; Jiang, Yixiao 1,2; Yao, Tingting 1,2; Tao, Ang 2; Yan, Xuexi 2; Gao, Chunyang 2; Li, Xiang 2; Ohta, Hiromichi 3; Chen, Chunlin 1,2; Ma, Xiu-Liang 2
刊名	APPLIED SURFACE SCIENCE
	2022-06-15
卷号	587 页码:8
关键词	La2Ti2O7 Transmission electron microscopy Layered perovskite material First-principles calculations
ISSN号	0169-4332
DOI	10.1016/j.apsusc.2021.151599
通讯作者	Chen, Chunlin(clchen@imr.ac.cn)
英文摘要	La2Ti2O7 has recently received extensive interest due to its attractive ferroelectric and photocatalytic properties. Here, high-quality La2Ti2O7 thin films on (110) SrTiO3 substrates are prepared via oxidation of LaTiO3 thin films that are fabricated by pulsed-laser deposition. X-ray diffraction analyses reveal that the La2Ti2O7 thin film grows epitaxially on the (110) SrTiO3 substrate and has a good crystallinity. Atomic force microscopy investigations suggest that the surface of La2Ti2O7 thin film turns into a stepped and terraced structure after the annealing. Xray photoelectron spectroscopy analyses indicate that the La2Ti2O7 thin film has a high purity and contain only Ti4+ ions (i.e., without Ti3+ ions). The band gap of the La2Ti2O7 film is measured to be-3.2 eV by UV-visible spectra. Atomic and electronic structures of the La2Ti2O7/SrTiO3 heterointerface have been studied by a combination of transmission electron microscopy and first-principles calculations. The La2Ti2O7/SrTiO3 heterointerface is atomically abrupt and coherent. Electronically, this heterointerface contributes to the decrease of band gap of La2Ti2O7 near the interface. The reduction of spontaneous polarization in La2Ti2O7 is localized in two layers of TiO6 octahedra near the interface due to the discontinuous Ti-O bonds between the perovskite layers of La2Ti2O7.
资助项目	National Natural Science Foundation of China[51971224] ; National Natural Science Foundation of China[51771200] ; National Natural Science Foundation of China[51801215] ; National Natural Science Foundation of China[52125101] ; LiaoNing Revitalization Talents Program[XLYC1802088] ; Key Research Program of Frontier Sciences, CAS[QYZDY-SSW-JSC027] ; CAS Interdisciplinary Innovation Team[292020000008] ; Ji Hua Laboratory Project[X210141TL210] ; JSPS[19H05791]
WOS研究方向	Chemistry ; Materials Science ; Physics
语种	英语
出版者	ELSEVIER
WOS记录号	WOS:000777587700001
资助机构	National Natural Science Foundation of China ; LiaoNing Revitalization Talents Program ; Key Research Program of Frontier Sciences, CAS ; CAS Interdisciplinary Innovation Team ; Ji Hua Laboratory Project ; JSPS
内容类型	期刊论文
源URL	[http://ir.imr.ac.cn/handle/321006/172948]
专题	金属研究所_中国科学院金属研究所
通讯作者	Chen, Chunlin
作者单位	1.Ji Hua Lab, Foshan 528200, Peoples R China 2.Univ Sci & Technol China, Chinese Acad Sci, Sch Mat Sci & Engn, Shenyang Natl Lab Mat Sci,Inst Met Res, Shenyang 110016, Peoples R China 3.Hokkaido Univ, Res Inst Elect Sci, Kita Ku, N20W10, Sapporo, Hokkaido 0010020, Japan
推荐引用方式 GB/T 7714	Qiao, Beibei,Jiang, Yixiao,Yao, Tingting,et al. Microstructure and electrical properties of La2Ti2O7 thin films on SrTiO3 substrates[J]. APPLIED SURFACE SCIENCE,2022,587:8.
APA	Qiao, Beibei.,Jiang, Yixiao.,Yao, Tingting.,Tao, Ang.,Yan, Xuexi.,...&Ye, Hengqiang.(2022).Microstructure and electrical properties of La2Ti2O7 thin films on SrTiO3 substrates.APPLIED SURFACE SCIENCE,587,8.
MLA	Qiao, Beibei,et al."Microstructure and electrical properties of La2Ti2O7 thin films on SrTiO3 substrates".APPLIED SURFACE SCIENCE 587(2022):8.