The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates

	The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates
	Yafang Shi; Longlong Wang; Xiaofen Qiao; Shuai Li; Yi Liu; Xiaoli Li ; Xiaohui Zhao
刊名	NANOSCALE RESEARCH LETTERS
	2020
卷号	15 期号:1 页码:43
内容类型	期刊论文
源URL	[http://ir.semi.ac.cn/handle/172111/30520]
专题	半导体研究所_半导体超晶格国家重点实验室
推荐引用方式 GB/T 7714	Yafang Shi; Longlong Wang; Xiaofen Qiao; Shuai Li; Yi Liu; Xiaoli Li ; Xiaohui Zhao. The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates[J]. NANOSCALE RESEARCH LETTERS,2020,15(1):43.
APA	Yafang Shi; Longlong Wang; Xiaofen Qiao; Shuai Li; Yi Liu; Xiaoli Li ; Xiaohui Zhao.(2020).The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates.NANOSCALE RESEARCH LETTERS,15(1),43.
MLA	Yafang Shi; Longlong Wang; Xiaofen Qiao; Shuai Li; Yi Liu; Xiaoli Li ; Xiaohui Zhao."The Polarization Properties of the Reflection Spectra of Single-Layer MoS2 and ReS2 on SiO2/Si and Quartz Substrates".NANOSCALE RESEARCH LETTERS 15.1(2020):43.