Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal | |
Li, YD (Li, Yudong); Liu, BK (Liu, Bingkai); Wen, L (Wen, Lin); Wei, Y (Wei, Ying); Zhou, D (Zhou, Dong); Feng, J (Feng, Jie); Guo, Q (Guo, Qi) | |
刊名 | RADIATION PHYSICS AND CHEMISTRY |
2021 | |
卷号 | 189期号:12页码:1-5 |
关键词 | Radiation effectsTotal ionizing dose (TID)Charge coupled device (CCD)Dark signalOxide trapped charges |
ISSN号 | 0969-806X |
DOI | 10.1016/j.radphyschem.2021.109722 |
英文摘要 | Two types of charge-coupled devices (CCDs) have been irradiated by 60Co gamma-ray and dark signal is characterized before and after irradiation. After exposure to gamma-ray, the evolution of mean dark signal exhibits an inflection point specific to a certain total ionizing dose (TID) value, beyond which dark signal increase rate rapidly reaches a level higher than the ones measured at other TIDs. The cause of inflection point occurrence is analyzed through the use of annealing tool and technology computer-aided design (TCAD) simulation in the custom CCDs. The experimental results demonstrate that when the cumulative oxide charge density achieves a specific value which depends on the fabrication process of the field oxide of CCDs, a sudden increase in dark signal occurs due to a merge between the space charge region and the additional depletion region induced by the oxide trapped charges. |
WOS记录号 | WOS:000702924200007 |
内容类型 | 期刊论文 |
源URL | [http://ir.xjipc.cas.cn/handle/365002/7954] |
专题 | 新疆理化技术研究所_中国科学院特殊环境功能材料与器件重点试验室 |
通讯作者 | Li, YD (Li, Yudong) |
作者单位 | 1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 2.Xinjiang Key Lab Elect Informat Mat & Device, Urumqi 830011, Peoples R China 3.Chinese Acad Sci, Xinjiang Tech Inst Phys & Chem, Key Lab Funct Mat & Devices Special Environm, Urumqi 830011, Peoples R China |
推荐引用方式 GB/T 7714 | Li, YD ,Liu, BK ,Wen, L ,et al. Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal[J]. RADIATION PHYSICS AND CHEMISTRY,2021,189(12):1-5. |
APA | Li, YD .,Liu, BK .,Wen, L .,Wei, Y .,Zhou, D .,...&Guo, Q .(2021).Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal.RADIATION PHYSICS AND CHEMISTRY,189(12),1-5. |
MLA | Li, YD ,et al."Role of the oxide trapped charges in charge coupled device ionizing radiation-induced dark signal".RADIATION PHYSICS AND CHEMISTRY 189.12(2021):1-5. |
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