Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications

doi:10.1016/j.jmst.2021.02.025

CORC > 金属研究所 > 中国科学院金属研究所

	Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications
	Chen, Hong-Lei 1,2; Luo, Xue-Mei 1; Wang, Dong 3,4; Schaaf, Peter 3,4; Zhang, Guang-Ping 1
刊名	JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY
	2021-10-30
卷号	89 页码:107-113
关键词	Thin films Ti interlayer Fatigue Extrusion Interface
ISSN号	1005-0302
DOI	10.1016/j.jmst.2021.02.025
通讯作者	Luo, Xue-Mei(xmluo@imr.ac.cn) ; Zhang, Guang-Ping(gpzhang@imr.ac.cn)
英文摘要	The fatigue damage behavior of the nanocrystalline Au films on polyimide substrates was investigated. It was found that the very high-cycle fatigue damage resistance of the Au film was significantly enhanced by at least a factor of similar to 2 in supported loading through adding an ultrathin Ti interlayer at the Au film/polyimide interface. Such a better fatigue damage resistance is mainly ascribed to the effective suppression of voiding at the Au film/polyimide interface through modulation of the Au/Ti interface, and thus the propensity of the cyclic strain localization and grain boundary cracking is reduced. The finding may provide a potential strategy for the design of flexible devices with ultra-long fatigue life. (C) 2021 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology.
资助项目	National Natural Science Foundation of China (NSFC)[52071319] ; National Natural Science Foundation of China (NSFC)[51601198] ; National Natural Science Foundation of China (NSFC)[51771207] ; Institute of Metal Research (IMR) ; Natural Science Foundation of Liaoning Province of China[20180510025] ; Shenyang National Laboratory for Materials Science[L2019F23]
WOS研究方向	Materials Science ; Metallurgy & Metallurgical Engineering
语种	英语
出版者	JOURNAL MATER SCI TECHNOL
WOS记录号	WOS:000697346300002
资助机构	National Natural Science Foundation of China (NSFC) ; Institute of Metal Research (IMR) ; Natural Science Foundation of Liaoning Province of China ; Shenyang National Laboratory for Materials Science
内容类型	期刊论文
源URL	[http://ir.imr.ac.cn/handle/321006/167023]
专题	金属研究所_中国科学院金属研究所
通讯作者	Luo, Xue-Mei; Zhang, Guang-Ping
作者单位	1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China 2.Univ Sci & Technol China, Sch Mat Sci & Engn, Shenyang 110016, Peoples R China 3.TU Ilmenau, Inst Mat Engn, Gustav Kirchhoff Str 5, D-98693 Ilmenau, Germany 4.TU Ilmenau, Inst Micro & Nanotechnol MacroNano, Gustav Kirchhoff Str 5, D-98693 Ilmenau, Germany
推荐引用方式 GB/T 7714	Chen, Hong-Lei,Luo, Xue-Mei,Wang, Dong,et al. Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications[J]. JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,2021,89:107-113.
APA	Chen, Hong-Lei,Luo, Xue-Mei,Wang, Dong,Schaaf, Peter,&Zhang, Guang-Ping.(2021).Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications.JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,89,107-113.
MLA	Chen, Hong-Lei,et al."Achieving very high cycle fatigue performance of Au thin films for flexible electronic applications".JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY 89(2021):107-113.