Enhanced damage induced by secondary high-energy electrons

doi:10.1103/PhysRevA.102.032809

	Enhanced damage induced by secondary high-energy electrons
	Yan, S.1,2; Zhu, X. L.1,2; Zhang, S. F.1,2; Zhao, D. M.1,2; Zhang, P.4; Wei, B.3,5; Ma, X.1,2
刊名	PHYSICAL REVIEW A
	2020-09-11
卷号	102 期号:3 页码:6
ISSN号	2469-9926
DOI	10.1103/PhysRevA.102.032809
通讯作者	Ma, X.(x.ma@impcas.ac.cn)
英文摘要	A new kind of radiotherapy scheme based on the resonant Auger-interatomic Coulombic decay mechanism (RA ICD) was proposed in the work of Gokhberg et al. [Nature 505, 661 (2014)], which may effectively reduce the overall radiation dose in traditional x-ray radiotherapy. An electron produced in this scheme carries most of the energy of the primary x-ray photon. Through the present experiment using an energetic electron impact on a NeAr dimer, we demonstrate that three processes, namely, the interatomic Coulombic decay triggered by a Ne 2s electron ionization, ICD triggered by Ar+* (3p(4)nl >= 5d), and charge transfer in the Ar2+ Ne ion, can take place and enhance the yields of slow electrons and ions. Therefore, energetic secondary electrons make the x-ray RA ICD scheme more toxic in radiotherapy.
资助项目	National Key R&D Program of China[2017YFA0402300] ; National Nature Science Foundation of China (NSFC)[U1832201] ; Youth Innovation Promotion Association of the Chinese Academy of Sciences[2018448] ; NSFC[U1532129]
WOS关键词	INTERATOMIC COULOMBIC DECAY ; MOMENTUM SPECTROSCOPY ; CROSS-SECTIONS ; RECOIL-ION ; ARGON ; PHOTOIONIZATION ; DIMERS ; AR ; FRAGMENTATION ; RADIATION
WOS研究方向	Optics ; Physics
语种	英语
出版者	AMER PHYSICAL SOC
WOS记录号	WOS:000571474900011
资助机构	National Key R&D Program of China ; National Nature Science Foundation of China (NSFC) ; Youth Innovation Promotion Association of the Chinese Academy of Sciences ; NSFC
内容类型	期刊论文
源URL	[http://119.78.100.186/handle/113462/139613]
专题	中国科学院近代物理研究所
通讯作者	Ma, X.
作者单位	1.Univ Chinese Acad Sci, Beijing 100049, Peoples R China 2.Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China 3.Fudan Univ, Inst Modern Phys, Dept Nucl Sci & Technol, Shanghai 200433, Peoples R China 4.Swiss Fed Inst Technol, Lab Phys Chem, CH-8093 Zurich, Switzerland 5.Fudan Univ, Key Lab Nucl Phys & Ion Beam Applicat MOE, Shanghai 200433, Peoples R China
推荐引用方式 GB/T 7714	Yan, S.,Zhu, X. L.,Zhang, S. F.,et al. Enhanced damage induced by secondary high-energy electrons[J]. PHYSICAL REVIEW A,2020,102(3):6.
APA	Yan, S..,Zhu, X. L..,Zhang, S. F..,Zhao, D. M..,Zhang, P..,...&Ma, X..(2020).Enhanced damage induced by secondary high-energy electrons.PHYSICAL REVIEW A,102(3),6.
MLA	Yan, S.,et al."Enhanced damage induced by secondary high-energy electrons".PHYSICAL REVIEW A 102.3(2020):6.