Controllable A-T Splitting and Spatial Splitting Inside a Cascade Three-Level Atomic System
Zhang, Yan1,3; Li, Yuanyuan2; Hao, Minru3; Zhang, Yunzhe2
刊名JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS
2021-05
卷号16期号:5页码:786-790
关键词Four-Wave Mixing Electromagnetically Induced Transparency Autler-Townes
ISSN号1555-130X;1555-1318
DOI10.1166/jno.2021.2991
产权排序1
英文摘要

We illustrate the experimental observations of Autler-Townes splitting and the spatial splitting in an elec-tromagnetically induced transparency window in a atomic vapor system of D1 line. As the power of the dressing laser beam changes, we study first-order and secondary Autler-Townes splitting. The influences of these dressing beams, which lead to the larger spatial splitting of four-wave mixing and the shift of probe transmission signal with by changing frequency detuning. Studies on such controllable Autler-Townes split-ting and spatial splitting effect can be very useful in applications of spatial signal processing and optical communication.

语种英语
出版者AMER SCIENTIFIC PUBLISHERS
WOS记录号WOS:000691377900004
内容类型期刊论文
源URL[http://ir.opt.ac.cn/handle/181661/95031]  
专题西安光学精密机械研究所_瞬态光学技术国家重点实验室
通讯作者Zhang, Yunzhe
作者单位1.Chinese Acad Sci, State Key Lab Transient Opt & Photon, Beijing 710119, Peoples R China
2.Xian Univ, Sch Mech & Mat Engn, Atom & Mol Phys Key Discipline Shaanxi Prov, Xian 710065, Shaanxi, Peoples R China
3.Xian Shi You Univ, Sch Sci, Xian 710065, Shaanxi, Peoples R China
推荐引用方式
GB/T 7714
Zhang, Yan,Li, Yuanyuan,Hao, Minru,et al. Controllable A-T Splitting and Spatial Splitting Inside a Cascade Three-Level Atomic System[J]. JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS,2021,16(5):786-790.
APA Zhang, Yan,Li, Yuanyuan,Hao, Minru,&Zhang, Yunzhe.(2021).Controllable A-T Splitting and Spatial Splitting Inside a Cascade Three-Level Atomic System.JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS,16(5),786-790.
MLA Zhang, Yan,et al."Controllable A-T Splitting and Spatial Splitting Inside a Cascade Three-Level Atomic System".JOURNAL OF NANOELECTRONICS AND OPTOELECTRONICS 16.5(2021):786-790.
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