Effect of stress profile on microstructure evolution of cold-drawn commercially pure aluminum wire analyzed by finite element simulation | |
Zhu, Y. K.1; Chen, Q. Y.2; Wang, Q.1; Yu, H. Y.2; Li, R.2; Hou, J. P.1; Zhang, Z. J.1; Zhang, G. P.1; Zhang, Z. F.1 | |
刊名 | JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY |
2018-07-01 | |
卷号 | 34期号:7页码:1214-1221 |
关键词 | Commercially pure aluminum wire Cold drawing Texture Finite element simulation Stress profile |
ISSN号 | 1005-0302 |
DOI | 10.1016/j.jmst.2017.07.011 |
通讯作者 | Wang, Q.(gmwang@imr.ac.cn) |
英文摘要 | The evolution of microstructure in the drawing process of commercially pure aluminum wire (CPAW) does not only depend on the nature of materials, but also on the stress profile. In this study, the effect of stress profile on the texture evolution of the CPAW was systematically investigated by combining the numerical simulation and the microstructure observation. The results show that the tensile stress at the wire center promotes the formation of <111> texture, whereas the shear stress nearby the rim makes little contribution to the texture formation. Therefore, the <111> texture at the wire center is stronger than that in the surface layer, which also results in a higher microhardness at the center of the CPAW under axial loading. (C) 2017 Published by Elsevier Ltd on behalf of The editorial office of Journal of Materials Science & Technology. |
资助项目 | State Grid Corporation of China[52110416001z] ; National Natural Science Foundation of China[51331007] |
WOS研究方向 | Materials Science ; Metallurgy & Metallurgical Engineering |
语种 | 英语 |
出版者 | JOURNAL MATER SCI TECHNOL |
WOS记录号 | WOS:000434132800019 |
资助机构 | State Grid Corporation of China ; National Natural Science Foundation of China |
内容类型 | 期刊论文 |
源URL | [http://ir.imr.ac.cn/handle/321006/128176] |
专题 | 金属研究所_中国科学院金属研究所 |
通讯作者 | Wang, Q. |
作者单位 | 1.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Liaoning, Peoples R China 2.Zhejiang Huadian Equipment Testing Inst, Natl Qual Supervis & Inspect Ctr Elect Equipment, Hangzhou 310015, Zhejiang, Peoples R China |
推荐引用方式 GB/T 7714 | Zhu, Y. K.,Chen, Q. Y.,Wang, Q.,et al. Effect of stress profile on microstructure evolution of cold-drawn commercially pure aluminum wire analyzed by finite element simulation[J]. JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,2018,34(7):1214-1221. |
APA | Zhu, Y. K..,Chen, Q. Y..,Wang, Q..,Yu, H. Y..,Li, R..,...&Zhang, Z. F..(2018).Effect of stress profile on microstructure evolution of cold-drawn commercially pure aluminum wire analyzed by finite element simulation.JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY,34(7),1214-1221. |
MLA | Zhu, Y. K.,et al."Effect of stress profile on microstructure evolution of cold-drawn commercially pure aluminum wire analyzed by finite element simulation".JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY 34.7(2018):1214-1221. |
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