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Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film
Zhang, M.2,3; Ma, X. L.3; Li, D. X.3; Xie, S. J.1,2; Chang, R. P. H.1,2
刊名MATERIALS CHEMISTRY AND PHYSICS
2008-12-20
卷号112期号:3页码:756-761
关键词Microstructure characterization Transmission electron microscopy Interface structure Defects Orientation relationship Perovskite thin films
ISSN号0254-0584
DOI10.1016/j.matchemphys.2008.06.033
通讯作者Zhang, M.(ming-zhang@northwestern.edu)
英文摘要Perovskite-based BaNb0.2Ti0.8O3 (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO3 (001) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb0.2Ti0.8O3 film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains. (C) 2008 Elsevier B.V. All rights reserved.
资助项目National Outstanding Young Scientist Foundation[50325101] ; Special Funds for the Major State Basic Research Projects of China[2002CB613503]
WOS研究方向Materials Science
语种英语
出版者ELSEVIER SCIENCE SA
WOS记录号WOS:000262183900011
资助机构National Outstanding Young Scientist Foundation ; Special Funds for the Major State Basic Research Projects of China
内容类型期刊论文
源URL[http://ir.imr.ac.cn/handle/321006/95398]  
专题金属研究所_中国科学院金属研究所
通讯作者Zhang, M.
作者单位1.Northwestern Univ, Inst Mat Res, Evanston, IL 60208 USA
2.Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA
3.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China
推荐引用方式
GB/T 7714
Zhang, M.,Ma, X. L.,Li, D. X.,et al. Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film[J]. MATERIALS CHEMISTRY AND PHYSICS,2008,112(3):756-761.
APA Zhang, M.,Ma, X. L.,Li, D. X.,Xie, S. J.,&Chang, R. P. H..(2008).Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film.MATERIALS CHEMISTRY AND PHYSICS,112(3),756-761.
MLA Zhang, M.,et al."Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film".MATERIALS CHEMISTRY AND PHYSICS 112.3(2008):756-761.
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