Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film | |
Zhang, M.2,3; Ma, X. L.3; Li, D. X.3; Xie, S. J.1,2; Chang, R. P. H.1,2 | |
刊名 | MATERIALS CHEMISTRY AND PHYSICS |
2008-12-20 | |
卷号 | 112期号:3页码:756-761 |
关键词 | Microstructure characterization Transmission electron microscopy Interface structure Defects Orientation relationship Perovskite thin films |
ISSN号 | 0254-0584 |
DOI | 10.1016/j.matchemphys.2008.06.033 |
通讯作者 | Zhang, M.(ming-zhang@northwestern.edu) |
英文摘要 | Perovskite-based BaNb0.2Ti0.8O3 (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO3 (001) substrate, was investigated by means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) imaging, and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission electron microscope. The microstructure of the BaNb0.2Ti0.8O3 film is clarified in terms of various domains due to tetragonal characteristics. Compositional fluctuation was observed in the various domains and domain boundaries. The misfit strain and element diffusivity during the film growth together with inherent tetragonal characteristics are discussed as a possible mechanism for the formation and distribution of various domains. (C) 2008 Elsevier B.V. All rights reserved. |
资助项目 | National Outstanding Young Scientist Foundation[50325101] ; Special Funds for the Major State Basic Research Projects of China[2002CB613503] |
WOS研究方向 | Materials Science |
语种 | 英语 |
出版者 | ELSEVIER SCIENCE SA |
WOS记录号 | WOS:000262183900011 |
资助机构 | National Outstanding Young Scientist Foundation ; Special Funds for the Major State Basic Research Projects of China |
内容类型 | 期刊论文 |
源URL | [http://ir.imr.ac.cn/handle/321006/95398] |
专题 | 金属研究所_中国科学院金属研究所 |
通讯作者 | Zhang, M. |
作者单位 | 1.Northwestern Univ, Inst Mat Res, Evanston, IL 60208 USA 2.Northwestern Univ, Dept Mat Sci & Engn, Evanston, IL 60208 USA 3.Chinese Acad Sci, Inst Met Res, Shenyang Natl Lab Mat Sci, Shenyang 110016, Peoples R China |
推荐引用方式 GB/T 7714 | Zhang, M.,Ma, X. L.,Li, D. X.,et al. Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film[J]. MATERIALS CHEMISTRY AND PHYSICS,2008,112(3):756-761. |
APA | Zhang, M.,Ma, X. L.,Li, D. X.,Xie, S. J.,&Chang, R. P. H..(2008).Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film.MATERIALS CHEMISTRY AND PHYSICS,112(3),756-761. |
MLA | Zhang, M.,et al."Microstructure and microanalysis of BaNb0.2Ti0.8O3 thin film".MATERIALS CHEMISTRY AND PHYSICS 112.3(2008):756-761. |
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