Chromatic dispersion characterization for meter-long CMOS compatible spiral waveguides

	Chromatic dispersion characterization for meter-long CMOS compatible spiral waveguides
	Zeng, Lanqian 2; Wang, Linghua 2; Li, Yuhua 3; Chu, Sai T.3; Little, Brent E.1; Wang, Shao Hao 2
	2020
会议日期	2020-08-03
会议地点	ELECTR NETWORK
DOI	10.1364/CLEOPR.2020.C11H_5
英文摘要	We demonstrated that the chromatic dispersion of CMOS-compatible waveguide sets increases with their thickness from 465 to 45 ps/nm/km by extending the measuring range of interferometer -based scheme beyond the maximum length of optical delay line. (C) 2020 The Author(s)
产权排序	3
会议录	2020 CONFERENCE ON LASERS AND ELECTRO-OPTICS PACIFIC RIM (CLEO-PR)
会议录出版者	IEEE
语种	英语
ISBN号	978-0-646-82504-5
WOS记录号	WOS:000637291000135
内容类型	会议论文
源URL	[http://ir.opt.ac.cn/handle/181661/94834]
专题	西安光学精密机械研究所_瞬态光学技术国家重点实验室
通讯作者	Wang, Shao Hao
作者单位	1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China 2.Fuzhou Univ, Dept Microelect Sci & Technol, Qi Shan Campus, Fuzhou 350108, Peoples R China 3.City Univ Hong Kong, Dept Phys, Kowloon Tong, Hong Kong, Peoples R China
推荐引用方式 GB/T 7714	Zeng, Lanqian,Wang, Linghua,Li, Yuhua,et al. Chromatic dispersion characterization for meter-long CMOS compatible spiral waveguides[C]. 见:. ELECTR NETWORK. 2020-08-03.