Super-resolution and optical sectioning integrated structured illumination microscopy | |
Dan, Dan1; Gao, Peng2; Zhao, Tianyu1,3; Dang, Shipei1,3; Qian, Jia1,3; Lei, Ming1; Min, Junwei1; Yu, Xianghua1; Yao, Baoli1,3 | |
刊名 | JOURNAL OF PHYSICS D-APPLIED PHYSICS |
2021-02-18 | |
卷号 | 54期号:7 |
关键词 | structured illumination microscopy super-resolution optical sectioning |
ISSN号 | 0022-3727;1361-6463 |
DOI | 10.1088/1361-6463/abc4a8 |
产权排序 | 1 |
英文摘要 | Super-resolution structured illumination microscopy (SR-SIM) has attracted a great deal of attention in the past few decades. As a wide-field imaging technique, SR-SIM usually suffers from issues relating to out-of-focus background, particularly when imaging thick samples. In this study, we develop an integrated SIM with simultaneous SR and optical sectioning (OS) capabilities, facilitating SR imaging of stacked optical sections, with the out-of-focus background suppressed. The combination of the merits of SR and OS is realized by means of a new image reconstruction algorithm. We confirm the validity of the integrated SIM, both experimentally and in simulation. We anticipate that this integrated SIM will assist biologists in obtaining much clearer SR images in relation to thick specimens. |
语种 | 英语 |
出版者 | IOP PUBLISHING LTD |
WOS记录号 | WOS:000595248500001 |
内容类型 | 期刊论文 |
源URL | [http://ir.opt.ac.cn/handle/181661/94032] |
专题 | 西安光学精密机械研究所_瞬态光学技术国家重点实验室 |
通讯作者 | Yao, Baoli |
作者单位 | 1.Chinese Acad Sci, Xian Inst Opt & Precis Mech, State Key Lab Transient Opt & Photon, Xian 710119, Peoples R China 2.Xidian Univ, Sch Phys & Optoelect Engn, Xian 710071, Peoples R China 3.Univ Chinese Acad Sci, Beijing 100049, Peoples R China |
推荐引用方式 GB/T 7714 | Dan, Dan,Gao, Peng,Zhao, Tianyu,et al. Super-resolution and optical sectioning integrated structured illumination microscopy[J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS,2021,54(7). |
APA | Dan, Dan.,Gao, Peng.,Zhao, Tianyu.,Dang, Shipei.,Qian, Jia.,...&Yao, Baoli.(2021).Super-resolution and optical sectioning integrated structured illumination microscopy.JOURNAL OF PHYSICS D-APPLIED PHYSICS,54(7). |
MLA | Dan, Dan,et al."Super-resolution and optical sectioning integrated structured illumination microscopy".JOURNAL OF PHYSICS D-APPLIED PHYSICS 54.7(2021). |
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