Defect-induced magnetism in SiC probed by nuclear magnetic resonance
Z. T. Zhang1,2; D. Dmytriieva2,3; S. Molatta2,3; J. Wosnitza2,3; Yutian Wang1,4; M. Helm1,3; Shengqiang Zhou1; H. K¨uhne2
刊名PHYSICAL REVIEW B
2017-02-08
语种英语
内容类型期刊论文
源URL[http://ir.hfcas.ac.cn:8080/handle/334002/92752]  
专题合肥物质科学研究院_中科院强磁场科学中心
通讯作者Z. T. Zhang; H. K¨uhne
作者单位1.Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, D-01314 Dresden, Germany
2.Hochfeld-Magnetlabor Dresden (HLD-EMFL), Helmholtz-Zentrum Dresden-Rossendorf, D-01314 Dresden, Germany
3.TU Dresden, D-01062 Dresden, Germany
4.School of Microelectronics, Key Laboratory of Wide Band-Gap Semiconductor Materials and Devices, Xidian University, Xi’ an 710071, China
推荐引用方式
GB/T 7714
Z. T. Zhang,D. Dmytriieva,S. Molatta,et al. Defect-induced magnetism in SiC probed by nuclear magnetic resonance[J]. PHYSICAL REVIEW B,2017.
APA Z. T. Zhang.,D. Dmytriieva.,S. Molatta.,J. Wosnitza.,Yutian Wang.,...&H. K¨uhne.(2017).Defect-induced magnetism in SiC probed by nuclear magnetic resonance.PHYSICAL REVIEW B.
MLA Z. T. Zhang,et al."Defect-induced magnetism in SiC probed by nuclear magnetic resonance".PHYSICAL REVIEW B (2017).
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