Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices | |
Yuan Li; Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen | |
刊名 | Journal of Applied Physics
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2019 | |
卷号 | 126期号:6页码:065704 |
语种 | 英语 |
内容类型 | 期刊论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/29556] ![]() |
专题 | 半导体研究所_中科院半导体材料科学重点实验室 |
推荐引用方式 GB/T 7714 | Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen. Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices[J]. Journal of Applied Physics,2019,126(6):065704. |
APA | Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen.(2019).Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices.Journal of Applied Physics,126(6),065704. |
MLA | Yuan Li;Fengqi Liu; Xiaoling Ye; Yu Liu; Jiawei Wang; Yonghai Chen."Quantitative investigation of intrinsic shear strain and asymmetric interface conditions in semiconductor superlattices".Journal of Applied Physics 126.6(2019):065704. |
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