An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures

doi:10.3390/ma12071141

	An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures
	Ma, Jiayu; Zhang, Yuzhi; Wu, Lingnan; Li, Haogeng; Song, Lixin
刊名	MATERIALS
	2019-04-10
卷号	12 期号:7
关键词	spectral emissivity radiation vacuum low temperature
ISSN号	1996-1944
DOI	10.3390/ma12071141
文献子类	Article
英文摘要	Thermal control materials are employed to adjust the temperature of a spacecraft operating in deep space. The spectral emissivity is a crucial factor in evaluating the thermal radiative properties of such materials. An apparatus, composed of a Fourier transform infrared spectrometer (FTIR), a sample cooling chamber and a mechanical modulation system was demonstrated to measure low temperature infrared spectral emissivity under vacuum. The mechanical modulation system, which includes a chopper and a lock-in amplifier, is employed to reduce the interference of background radiation during measurements. The limitation of the Fourier transform frequency on the chopper frequency can be eliminated by setting the FTIR on step-scan mode. The apparatus is separated into two parts and evacuated by different pumps. In this study, a high quality emission spectrum of a sample is measured by the apparatus. The spectral emissivity of thermal control materials are obtained in the wavelength range of 8 to 14 m at 173 and 213 K. The combined standard uncertainty of the apparatus is 3.30% at 213 K.
WOS研究方向	Materials Science
语种	英语
出版者	MDPI
内容类型	期刊论文
源URL	[http://ir.sic.ac.cn/handle/331005/27195]
专题	中国科学院上海硅酸盐研究所
推荐引用方式 GB/T 7714	Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,et al. An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures[J]. MATERIALS,2019,12(7).
APA	Ma, Jiayu,Zhang, Yuzhi,Wu, Lingnan,Li, Haogeng,&Song, Lixin.(2019).An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures.MATERIALS,12(7).
MLA	Ma, Jiayu,et al."An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures".MATERIALS 12.7(2019).