Comparison of active and passive methods for the infrared scanning near-field microscopy

doi:10.1063/1.5088056

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	Comparison of active and passive methods for the infrared scanning near-field microscopy
	Weng Qianchun; Panchal Vishal; Lin Kuan-Ting; Sun Liaoxin; Kajihara Yusuke; Tzalenchuk Alexander; Komiyama Susumu
刊名	APPLIED PHYSICS LETTERS
	2019
卷号	114 期号:15 页码:153101
关键词	ABSORPTION RADIATION NANOWIRES CARRIERS
DOI	10.1063/1.5088056
英文摘要	We systematically compare the active and the passive methods for infrared scattering-type scanning near-field optical microscopy (s-SNOM). The active SNOM makes use of IR lasers or incoherent thermal emitters to illuminate a sample, whereas the passive method directly measures extremely weak fluctuating electromagnetic evanescent fields spontaneously generated at the sample surface without any external illumination. For this reason, our specific version of the passive SNOM is called a scanning noise microscope (SNoiM). In thermal equilibrium, the two methods are shown to be similar, both mapping the nanoscale variation of the complex dielectric constant of the sample. We demonstrate that a significant difference between the two methods emerges when the sample is driven out of thermal equilibrium, viz., the active SNOM is insensitive whereas the SNoiM is extremely sensitive to the electron temperature in locally heated nanoregions. Published under license by AIP Publishing.
WOS记录号	WOS:465439100024
内容类型	期刊论文
源URL	[http://202.127.2.71:8080/handle/181331/12387]
专题	上海技术物理研究所_上海技物所
推荐引用方式 GB/T 7714	Weng Qianchun,Panchal Vishal,Lin Kuan-Ting,et al. Comparison of active and passive methods for the infrared scanning near-field microscopy[J]. APPLIED PHYSICS LETTERS,2019,114(15):153101.
APA	Weng Qianchun.,Panchal Vishal.,Lin Kuan-Ting.,Sun Liaoxin.,Kajihara Yusuke.,...&Komiyama Susumu.(2019).Comparison of active and passive methods for the infrared scanning near-field microscopy.APPLIED PHYSICS LETTERS,114(15),153101.
MLA	Weng Qianchun,et al."Comparison of active and passive methods for the infrared scanning near-field microscopy".APPLIED PHYSICS LETTERS 114.15(2019):153101.