Enhancement of phase retrieval capability in ptychography by using strongly scattering property of the probe-generating device
Zhang, JH; Fan, JD; Sun, ZB; Yao, SK; Tong, YJ; Tai, RZ; Jiang, HD
刊名OPTICS EXPRESS
2018
卷号26期号:23页码:30128-30145
关键词X-RAY CRYSTALLOGRAPHY TOMOGRAPHY ALGORITHM ALLOW CELLS FIELD
ISSN号1094-4087
DOI10.1364/OE.26.030128
文献子类期刊论文
英文摘要In common ptychographic coherent diffractive imaging (PCDI) systems, the probe-generating devices typically exhibit strong scattering, which is not fully used. Here, we report the reasonableness of using the diffraction pattern of the probe-generating device as the frequency-domain information of the scanning probe located in the sample plane, and we propose a method introducing this frequency-domain information into an iterative process to improve the imaging quality of PCDI. The new method was demonstrated using both a visible laser source and a synchrotron radiation X-ray source; the proposed method significantly improved the imaging quality in both demonstrations. (c) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
语种英语
内容类型期刊论文
源URL[http://ir.sinap.ac.cn/handle/331007/30937]  
专题上海应用物理研究所_中科院上海应用物理研究所2011-2017年
作者单位1.Chinese Acad Sci, Shanghai Inst Appl Phys, Shanghai Synchrotron Radiat Facil, Shanghai 201204, Peoples R China
2.Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Shandong, Peoples R China
3.ShanghaiTech Univ, Sch Phys Sci & Technol, Shanghai 201210, Peoples R China
4.ShanghaiTech Univ, iHuman Inst, Shanghai 201210, Peoples R China
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Zhang, JH,Fan, JD,Sun, ZB,et al. Enhancement of phase retrieval capability in ptychography by using strongly scattering property of the probe-generating device[J]. OPTICS EXPRESS,2018,26(23):30128-30145.
APA Zhang, JH.,Fan, JD.,Sun, ZB.,Yao, SK.,Tong, YJ.,...&Jiang, HD.(2018).Enhancement of phase retrieval capability in ptychography by using strongly scattering property of the probe-generating device.OPTICS EXPRESS,26(23),30128-30145.
MLA Zhang, JH,et al."Enhancement of phase retrieval capability in ptychography by using strongly scattering property of the probe-generating device".OPTICS EXPRESS 26.23(2018):30128-30145.
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