Manufacture of semiconductor element | |
MURAKAMI TOMOKI | |
1987-08-14 | |
著作权人 | NEC CORP |
专利号 | JP1987186525A |
国家 | 日本 |
文献子类 | 发明申请 |
其他题名 | Manufacture of semiconductor element |
英文摘要 | PURPOSE:To obtain a semiconductor element, whose element characteristics are improved, by forming a thin film comprising a material, whose dissociation pressure is lower than that of a semiconductor substrate on the semiconductor substrate, and providing a plurality of recess parts on the semiconductor substrate. CONSTITUTION:A thin film 2, which comprises a material, whose dissociation pressure is lower than that of a substrate 1, e.g., GaAs, and has a thickness of 1-3,000Angstrom , is formed on a semiconductor, e.g., the InP substrate A plurality of recess parts 3 reaching the upper part of the substrate 1 are formed from the thin film 2. Epitaxial layers 4-6 are formed on the substrate 1, in which the recess parts 3 are formed. Then the epitaxial layers 4, 5 and 6 are formed without the deformation of the shapes of the recess parts 3 due to heating. Thus, the semiconductor element, whose element characteristics are improved, is obtained. |
公开日期 | 1987-08-14 |
申请日期 | 1986-02-12 |
状态 | 失效 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/80707] |
专题 | 半导体激光器专利数据库 |
作者单位 | NEC CORP |
推荐引用方式 GB/T 7714 | MURAKAMI TOMOKI. Manufacture of semiconductor element. JP1987186525A. 1987-08-14. |
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