Method for manufacturing semiconductor optical device | |
HANAMAKI, YOSHIHIKO; NISHIDA, TAKEHIRO; TAKADA, MAKOTO; ONO, KENICHI | |
2010-03-23 | |
著作权人 | MITSUBISHI ELECTRIC CORPORATION |
专利号 | US7682857 |
国家 | 美国 |
文献子类 | 授权发明 |
其他题名 | Method for manufacturing semiconductor optical device |
英文摘要 | A method for manufacturing a semiconductor optical device includes: forming a p-type cladding layer; forming a capping layer on the p-type cladding layer, the capping layer being selectively etchable relative to the p-type cladding layer; forming a through film on the capping layer; forming a window structure by ion implantation; removing the through film after the ion implantation; and selectively removing the capping layer using a chemical solution. |
公开日期 | 2010-03-23 |
申请日期 | 2008-01-25 |
状态 | 失效 |
内容类型 | 专利 |
源URL | [http://ir.opt.ac.cn/handle/181661/73715] ![]() |
专题 | 半导体激光器专利数据库 |
作者单位 | MITSUBISHI ELECTRIC CORPORATION |
推荐引用方式 GB/T 7714 | HANAMAKI, YOSHIHIKO,NISHIDA, TAKEHIRO,TAKADA, MAKOTO,et al. Method for manufacturing semiconductor optical device. US7682857. 2010-03-23. |
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