Forming method for resist pattern
TSUJI SHINJI; OKAI MAKOTO; HATTORI SHINICHI; HIRAO MOTONAO; OISHI AKIO; MATSUMURA HIROYOSHI
1987-04-18
著作权人HITACHI LTD
专利号JP1987084515A
国家日本
文献子类发明申请
其他题名Forming method for resist pattern
英文摘要PURPOSE:To obtain a diffraction element whose phase is inverted in the middle, by applying a negative resist and a positive resist separately on the surface of a solid by a liftoff method. CONSTITUTION:An Az positive resist 2 and a spacer 3 formed of spin-on glass are applied on a substrate 1, and after heat treatment is conducted, an AZ positive resist is applied. Next, the resist 4 is patterned. After the spacer 3 is patterned, the exposed portion of the resist 2 and the resist 4 are removed. Then, after a negative resist 5 is applied separately, the spacer 3 is etched, part of the negative resist 5 is lifted off, and thus the coats of the positive resist 2 and the negative resist 5 are provided separately and alternately on the substrate The resists thus prepared are subjected to exposure and development, and thereby a diffraction grating having a phase shift of pi spatially is obtained.
公开日期1987-04-18
申请日期1985-10-09
状态失效
内容类型专利
源URL[http://ir.opt.ac.cn/handle/181661/64714]  
专题半导体激光器专利数据库
作者单位HITACHI LTD
推荐引用方式
GB/T 7714
TSUJI SHINJI,OKAI MAKOTO,HATTORI SHINICHI,et al. Forming method for resist pattern. JP1987084515A. 1987-04-18.
个性服务
查看访问统计
相关权益政策
暂无数据
收藏/分享
所有评论 (0)
暂无评论
 

除非特别说明,本系统中所有内容都受版权保护,并保留所有权利。


©版权所有 ©2017 CSpace - Powered by CSpace