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	Device for thermal resistance measurement of semiconductor laser
	SEKINO TOSHIAKI; KIMURA YOSHINARI
	1986-03-04
著作权人	NEC CORP
专利号	JP1986044490A
国家	日本
文献子类	发明申请
其他题名	Device for thermal resistance measurement of semiconductor laser
英文摘要	PURPOSE:To measure the thermal resistance with high accuracy by a method wherein, not utilizing the temperature coefficient of the electric parameters of elements, the effects of the variability are removed, and the amount of variation of measured parameters is increased even in the case of a small temperature- coefficient by increasing the DC input more than at the beginning of laser oscillation. CONSTITUTION:The current IF is so set as to give an output P0 by pulse-driving 2 a semiconductor laser At this time, the case temperature is T0. Next, the laser 1 is set at the same current IF as that in pulse drive by DC drive. Since the photo output at this time decrease with temperature rises of elements, this photo output is put into the same output P0 as that in pulse drive on adjustment by impressing DC to a Peltier element 11 from a power source 12, thus measuring the case temperature T1 of the laser From the above, the thermal resistance is given by an expression Rth=(T0-T1)/(VFXIF) and measured with high accuracy.
公开日期	1986-03-04
申请日期	1984-08-09
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62594]
专题	半导体激光器专利数据库
作者单位	NEC CORP
推荐引用方式 GB/T 7714	SEKINO TOSHIAKI,KIMURA YOSHINARI. Device for thermal resistance measurement of semiconductor laser. JP1986044490A. 1986-03-04.

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