| Birefringence measurement of polycrystalline silicon samples or the like | |
| WANG, BAOLIANG | |
| 2015-06-11 | |
| 著作权人 | HINDS INSTRUMENTS, INC. |
| 专利号 | WO2015084612A1 |
| 国家 | 世界知识产权组织 |
| 文献子类 | 发明申请 |
| 其他题名 | Birefringence measurement of polycrystalline silicon samples or the like |
| 英文摘要 | A birefringence measurement system includes a lens mounted for selective movement into and out of use in the optical setup so that a wide range of sample types can be handled by the system without reconfiguring the primary components of the optical setup of the system (moving the detector, changing the light source power, etc.) in a manner that would sacrifice the cost effectiveness, efficiency, mechanical reliability and repeatability of measurements for such systems. |
| 公开日期 | 2015-06-11 |
| 申请日期 | 2014-11-23 |
| 状态 | 未确认 |
| 内容类型 | 专利 |
| 源URL | [http://ir.opt.ac.cn/handle/181661/62555]  |
| 专题 | 半导体激光器专利数据库 |
| 作者单位 | HINDS INSTRUMENTS, INC. |
| 推荐引用方式 GB/T 7714 | WANG, BAOLIANG. Birefringence measurement of polycrystalline silicon samples or the like. WO2015084612A1. 2015-06-11. |
| 个性服务 |
| 查看访问统计 |
| 相关权益政策 |
| 暂无数据 |
| 收藏/分享 |
除非特别说明，本系统中所有内容都受版权保护，并保留所有权利。
修改评论