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	Wavelength modulation spectroscopy method and system
	LUNDQVIST, STEFAN; THORSÉN, PER-ARNE
	2007-06-20
著作权人	SIEMENS AKTIENGESELLSCHAFT
专利号	EP1798535A1
国家	欧洲专利局
文献子类	发明申请
其他题名	Wavelength modulation spectroscopy method and system
英文摘要	In a wavelength modulation spectroscopy method and system the wavelength of a light source is modulated with a frequency f0. The light of the light source is passed to a sample for interacting and thereafter detected and demodulated at a higher harmonic Nf0. For in-situ gas analysis in rough industrial environments with high dust loads, a fiber optic amplifier is used to boost the laser output power, thus enabling cross-duct or cross-stack measurement without the need of shortening the measurement path. To suppress non-linearities in the measurement caused by the optical amplifier (32), a portion of the output light (15) from the optical amplifier (32) is passed to a monitor detector (17). The monitor detector output is demodulated at said higher harmonic Nf0, and the modulation of the light source (14) is predistorted at said higher harmonic Nf0 in dependence on said demodulated monitor detector output.
公开日期	2007-06-20
申请日期	2005-12-15
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/62503]
专题	半导体激光器专利数据库
作者单位	SIEMENS AKTIENGESELLSCHAFT
推荐引用方式 GB/T 7714	LUNDQVIST, STEFAN,THORSÉN, PER-ARNE. Wavelength modulation spectroscopy method and system. EP1798535A1. 2007-06-20.

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