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	Methods and apparatus for analyzing waveguide couplers
	ALEGRIA, CARLOS; ZERVAS, MIKHAIL NICKOLAOS
	2003-05-01
著作权人	VERIDIAN INFORMATION SOLUTIONS, INC.
专利号	US20030081881A1
国家	美国
文献子类	发明申请
其他题名	Methods and apparatus for analyzing waveguide couplers
英文摘要	Methods for analyzing waveguide couplers are non-destructive, and comprise introducing probe light into a coupler; providing a source of perturbing radiation; presenting the coupling region of the coupler to the perturbing radiation to generate a temperature gradient across the waveguide, either from a direction so as to expose one waveguide before another waveguide and perturb the coupling region asymmetrically, or from a direction so as to expose the waveguides together and perturb the coupling region symmetrically; monitoring the power and/or phase of transmitted probe light, and repeating the presenting and monitoring along the length of the coupling region. Theoretical modeling shows that the transmitted probe light contains information from which can be derived the coupling profile, and power evolution and distribution along the coupling region, including location of the 50-50% points.
公开日期	2003-05-01
申请日期	2002-08-13
状态	失效
内容类型	专利
源URL	[http://ir.opt.ac.cn/handle/181661/52809]
专题	半导体激光器专利数据库
作者单位	VERIDIAN INFORMATION SOLUTIONS, INC.
推荐引用方式 GB/T 7714	ALEGRIA, CARLOS,ZERVAS, MIKHAIL NICKOLAOS. Methods and apparatus for analyzing waveguide couplers. US20030081881A1. 2003-05-01.

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