Hydrogen sensors based on Pt-AlGaN/GaN back-to-back Schottky diode | |
Wang, XH ; Wang, XL ; Xiao, HL ; Feng, C ; Wang, XY ; Wang, BZ ; Yang, CB ; Wang, JX ; Wang, CM ; Ran, JX ; Hu, GX ; Li, JM | |
2008 | |
会议名称 | 34th international symposium on compound semiconductors |
会议日期 | oct 15-18, 2007 |
会议地点 | kyoto, japan |
关键词 | GAS SENSORS HEMT STRUCTURES MOBILITY TEMPERATURE TRANSISTORS GROWTH MOCVD LAYER |
页码 | vol 5,no 9,5 (9): 2979-2981 |
通讯作者 | wang, xl, chinese acad sci, inst semicond, novel mat lab, pob 912, beijing 100083, peoples r china. |
中文摘要 | in this paper, platinum (pt) with a thickness of 45 nm was sputtered on the surface of algan/gan heterostructure to form the schottky contact and the back-to-back schottky diodes were characterized for h-2 sensing at room temperature. both the forward and reverse current of the devices increased with exposure to h-2 gas, which was attributed to schottky barrier height reduction caused by hydrogen absorption in the catalytic metals. a shift of 0.7 v at 297 k was obtained at a fixed forward current of 0.1 ma after switching from n-2 to 40% h-2 in n-2. the sensor's responses under different concentrations from 2500 ppm h-2 to 40% h-2 in n-2 at 297 k were investigated. time response of the sensor at a fixed bias of 1 v was given. finally, the decrease of the schottky barrier height and the sensitivity of the sensor were calculated. (c) 2008 wiley-vch verlag gmbh & co. kgaa, weinheim. |
英文摘要 | in this paper, platinum (pt) with a thickness of 45 nm was sputtered on the surface of algan/gan heterostructure to form the schottky contact and the back-to-back schottky diodes were characterized for h-2 sensing at room temperature. both the forward and reverse current of the devices increased with exposure to h-2 gas, which was attributed to schottky barrier height reduction caused by hydrogen absorption in the catalytic metals. a shift of 0.7 v at 297 k was obtained at a fixed forward current of 0.1 ma after switching from n-2 to 40% h-2 in n-2. the sensor's responses under different concentrations from 2500 ppm h-2 to 40% h-2 in n-2 at 297 k were investigated. time response of the sensor at a fixed bias of 1 v was given. finally, the decrease of the schottky barrier height and the sensitivity of the sensor were calculated. (c) 2008 wiley-vch verlag gmbh & co. kgaa, weinheim.; zhangdi于2010-03-09批量导入; made available in dspace on 2010-03-09t02:11:52z (gmt). no. of bitstreams: 1 654.pdf: 223093 bytes, checksum: 40969baf62ff18d3a8d70e956891c814 (md5) previous issue date: 2008; [wang, xinhua; wang, xiaoliang; xiao, hongling; feng, chun; wang, xiaoyan; wang, baozhu; yang, cuibai; wang, junxi; wang, cuimei; ran, junxue; hu, guoxin; li, jinmin] chinese acad sci, inst semicond, novel mat lab, beijing 100083, peoples r china |
收录类别 | CPCI-S |
会议录 | physica status solidi c - current topics in solid state physics |
会议录出版者 | wiley-v c h verlag gmbh ; pappelallee 3, w-69469 weinheim, germany |
会议录出版地 | pappelallee 3, w-69469 weinheim, germany |
学科主题 | 半导体材料 |
语种 | 英语 |
ISSN号 | 1610-1634 |
内容类型 | 会议论文 |
源URL | [http://ir.semi.ac.cn/handle/172111/7764] |
专题 | 半导体研究所_中国科学院半导体研究所(2009年前) |
推荐引用方式 GB/T 7714 | Wang, XH,Wang, XL,Xiao, HL,et al. Hydrogen sensors based on Pt-AlGaN/GaN back-to-back Schottky diode[C]. 见:34th international symposium on compound semiconductors. kyoto, japan. oct 15-18, 2007. |
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