A High-Speed Atomic and Friction Force Microscopic Imaging System Based on a Novel Optical Beam Deflection Design | |
Fan, Haiyun; Cai, Wei; Zhao, Jianyong; Shang, Guangyi | |
2013 | |
会议名称 | 2013 IEEE INTERNATIONAL CONFERENCE ON IMAGING SYSTEMS AND TECHNIQUES (IST 2013) |
会议日期 | 2013-01-01 |
关键词 | atomic force microscope high-speed friction force |
页码 | 437-440 |
收录类别 | EI ; CPCI-S |
URL标识 | 查看原文 |
WOS记录号 | WOS:000350344000087 |
内容类型 | 会议论文 |
URI标识 | http://www.corc.org.cn/handle/1471x/6563416 |
专题 | 北京航空航天大学 |
推荐引用方式 GB/T 7714 | Fan, Haiyun,Cai, Wei,Zhao, Jianyong,et al. A High-Speed Atomic and Friction Force Microscopic Imaging System Based on a Novel Optical Beam Deflection Design[C]. 见:2013 IEEE INTERNATIONAL CONFERENCE ON IMAGING SYSTEMS AND TECHNIQUES (IST 2013). 2013-01-01. |
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