| Reliability Modeling Method of Electronic Products Considering Failure Mechanism Dependence | |
| Chen, Ying; Ye, Cui; Zhang, Xiaoqin; Kang, Rui; Xue, Dan | |
| 2014 | |
| 会议名称 | 2014 IEEE 4TH ANNUAL INTERNATIONAL CONFERENCE ON CYBER TECHNOLOGY IN AUTOMATION, CONTROL, AND INTELLIGENT SYSTEMS (CYBER) |
| 会议日期 | 2014-01-01 |
| 页码 | 419-423 |
| 收录类别 | EI ; CPCI-S |
| URL标识 | 查看原文 |
| WOS记录号 | WOS:000366574900075 |
| 内容类型 | 会议论文 |
| URI标识 | http://www.corc.org.cn/handle/1471x/6551129 |
| 专题 | 北京航空航天大学 |
| 推荐引用方式 GB/T 7714 | Chen, Ying,Ye, Cui,Zhang, Xiaoqin,et al. Reliability Modeling Method of Electronic Products Considering Failure Mechanism Dependence[C]. 见:2014 IEEE 4TH ANNUAL INTERNATIONAL CONFERENCE ON CYBER TECHNOLOGY IN AUTOMATION, CONTROL, AND INTELLIGENT SYSTEMS (CYBER). 2014-01-01. |
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